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THE METHOD OF DETERMINING THE DIELECTRIC RELATIVE PERMITTIVITY IN THE MM AND SUBMM WAVELENGTH RANGES BASED ON THE MEASURING OF THE PLASMON-POLARITONE RESONANCE PARAMETERS

THE METHOD OF DETERMINING THE DIELECTRIC RELATIVE PERMITTIVITY IN THE MM AND SUBMM WAVELENGTH RANGES BASED ON THE MEASURING OF THE PLASMON-POLARITONE RESONANCE PARAMETERS

Purpose: The purpose of the work is to develop a new method for determining the complex dielectric permeability of dielectrics in mm and submm wavelength ranges.Design/methodology/approach: The proposed method consists in registration of parameters of a plasmon polariton resonance, which arises at d...

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Bibliographic Details
Main Authors: Lytvynenko, L. N., Myshenko, V. V., Bortsov, V. V., Lisachenko, V. M., Polikarpov, O. V., Gavrikov, V. K., Spevak, I. S.
Format: Article
Language:Ukrainian
Published: Видавничий дім «Академперіодика» 2020
Subjects:
measurement of optical characteristics
dielectric permeability
terahertz range
electromagnetic radiation diffraction
plasmon polariton resonance
вимірювання оптичних характеристик
діелектрична проникність
терагерцовий діапазон
дифракція електромагнітного випромінювання
плазмон-поляритонний резонанс
Online Access:http://rpra-journal.org.ua/index.php/ra/article/view/1339
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http://rpra-journal.org.ua/index.php/ra/article/view/1339

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