Оценка производственных погрешностей тонкопленочных элементов
A test circuit and calculation algorithms have been developed to determine systematic and random errors in the design parameters of a thin-film resistor. An experimental evaluation of these errors has been conducted. Formulas for calculating the dimensions of conductors and contact pads are provided...
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| Datum: | 2004 |
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| 1. Verfasser: | |
| Format: | Artikel |
| Sprache: | Ukrainisch |
| Veröffentlicht: |
PE "Politekhperiodika", Book and Journal Publishers
2004
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| Schlagworte: | |
| Online Zugang: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.4.50 |
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| Назва журналу: | Technology and design in electronic equipment |