Оценка производственных погрешностей тонкопленочных элементов

A test circuit and calculation algorithms have been developed to determine systematic and random errors in the design parameters of a thin-film resistor. An experimental evaluation of these errors has been conducted. Formulas for calculating the dimensions of conductors and contact pads are provided...

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Bibliographic Details
Date:2004
Main Author: Spirin, V. G.
Format: Article
Language:Ukrainian
Published: PE "Politekhperiodika", Book and Journal Publishers 2004
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Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.4.50
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Journal Title:Technology and design in electronic equipment

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Technology and design in electronic equipment

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