Экспресс-метод контроля качества полупроводниковых диодных кристаллов

• Date: 2004
• Main Authors: Pavljuk, S. P., Ishchuk, L. V., Kislitsyn, V. M.
• Format: Article
• Language: Ukrainian
• Published: PE "Politekhperiodika", Book and Journal Publishers 2004
• Subjects: тепловое поле; диод; диагностика; рекомбинация
• Online Access: https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.3.62
• Journal Title: Technology and design in electronic equipment

The feasibility of using infrared radiation from semiconductors for rapid diagnostics of the quality of semiconductor diode crystals is demonstrated. A method has been developed to separate the recombination and thermal components of the radiation emitted by a heated diode crystal. The possibility o...