Экспресс-метод контроля качества полупроводниковых диодных кристаллов
The feasibility of using infrared radiation from semiconductors for rapid diagnostics of the quality of semiconductor diode crystals is demonstrated. A method has been developed to separate the recombination and thermal components of the radiation emitted by a heated diode crystal. The possibility o...
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| Date: | 2004 |
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| Main Authors: | , , |
| Format: | Article |
| Language: | Ukrainian |
| Published: |
PE "Politekhperiodika", Book and Journal Publishers
2004
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| Subjects: | |
| Online Access: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.3.62 |
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| Journal Title: | Technology and design in electronic equipment |