Закономерности деградации светоизлучающих диодов
A method is proposed for testing gallium phosphide light-emitting diodes for service life, which significantly reduces the time required to reject unreliable diodes in production. The individual service life of each diode in a given batch is determined from two measured brightness values using a ref...
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| Datum: | 2004 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | Ukrainisch |
| Veröffentlicht: |
PE "Politekhperiodika", Book and Journal Publishers
2004
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| Schlagworte: | |
| Online Zugang: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.2.55 |
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| Назва журналу: | Technology and design in electronic equipment |