Закономерности деградации светоизлучающих диодов
A method is proposed for testing gallium phosphide light-emitting diodes for service life, which significantly reduces the time required to reject unreliable diodes in production. The individual service life of each diode in a given batch is determined from two measured brightness values using a ref...
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| Datum: | 2004 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | Ukrainisch |
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PE "Politekhperiodika", Book and Journal Publishers
2004
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| Online Zugang: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.2.55 |
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| Назва журналу: | Technology and design in electronic equipment |
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Technology and design in electronic equipment| _version_ | 1865485932277268480 |
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| author | Vikulin, I. М. Irkha, V. I. Korobitsyn, B. V. Gorbachev, V. E. |
| author_facet | Vikulin, I. М. Irkha, V. I. Korobitsyn, B. V. Gorbachev, V. E. |
| author_sort | Vikulin, I. М. |
| baseUrl_str | https://www.tkea.com.ua/index.php/journal/oai |
| collection | OJS |
| datestamp_date | 2026-05-17T18:48:17Z |
| description | A method is proposed for testing gallium phosphide light-emitting diodes for service life, which significantly reduces the time required to reject unreliable diodes in production. The individual service life of each diode in a given batch is determined from two measured brightness values using a reference graph constructed from the test results of a relatively small number of devices. |
| first_indexed | 2026-05-18T01:00:21Z |
| format | Article |
| id | oai:tkea.com.ua:article-1181 |
| institution | Technology and design in electronic equipment |
| keywords_txt_mv | keywords |
| language | Ukrainian |
| last_indexed | 2026-05-18T01:00:21Z |
| publishDate | 2004 |
| publisher | PE "Politekhperiodika", Book and Journal Publishers |
| record_format | ojs |
| spelling | oai:tkea.com.ua:article-11812026-05-17T18:48:17Z Regularities of degradation in light-emitting diodes Закономерности деградации светоизлучающих диодов Vikulin, I. М. Irkha, V. I. Korobitsyn, B. V. Gorbachev, V. E. light-emitting diode degradation conditioning rejection светодиод деградация приработка отбраковка A method is proposed for testing gallium phosphide light-emitting diodes for service life, which significantly reduces the time required to reject unreliable diodes in production. The individual service life of each diode in a given batch is determined from two measured brightness values using a reference graph constructed from the test results of a relatively small number of devices. Предложен метод тестирования фосфид-галлиевых светоизлучающих диодов на продолжительность срока службы, значительно сокращающий время отбраковки ненадежных светоизлучающих диодов в производстве. Индивидуальный срок службы каждого светоизлучающего диода из данной партии определяется по двум измеренным значениям яркости с помощью эталонного графика, который строится по результатам испытаний относительно небольшого количества изделий. PE "Politekhperiodika", Book and Journal Publishers 2004-04-30 Article Article Peer-reviewed Article application/pdf https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.2.55 Technology and design in electronic equipment; No. 2 (2004): Tekhnologiya i konstruirovanie v elektronnoi apparature; 55-56 Технологія та конструювання в електронній апаратурі; № 2 (2004): Технология и конструирование в электронной аппаратуре; 55-56 3083-6549 3083-6530 uk https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.2.55/1080 Copyright (c) 2004 Vikulin I. М., Irkha V. I., Korobitsyn B. V., Gorbachev V. E. http://creativecommons.org/licenses/by/4.0/ |
| spellingShingle | светодиод деградация приработка отбраковка Vikulin, I. М. Irkha, V. I. Korobitsyn, B. V. Gorbachev, V. E. Закономерности деградации светоизлучающих диодов |
| title | Закономерности деградации светоизлучающих диодов |
| title_alt | Regularities of degradation in light-emitting diodes |
| title_full | Закономерности деградации светоизлучающих диодов |
| title_fullStr | Закономерности деградации светоизлучающих диодов |
| title_full_unstemmed | Закономерности деградации светоизлучающих диодов |
| title_short | Закономерности деградации светоизлучающих диодов |
| title_sort | закономерности деградации светоизлучающих диодов |
| topic | светодиод деградация приработка отбраковка |
| topic_facet | light-emitting diode degradation conditioning rejection светодиод деградация приработка отбраковка |
| url | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.2.55 |
| work_keys_str_mv | AT vikulinim regularitiesofdegradationinlightemittingdiodes AT irkhavi regularitiesofdegradationinlightemittingdiodes AT korobitsynbv regularitiesofdegradationinlightemittingdiodes AT gorbachevve regularitiesofdegradationinlightemittingdiodes AT vikulinim zakonomernostidegradaciisvetoizlučaûŝihdiodov AT irkhavi zakonomernostidegradaciisvetoizlučaûŝihdiodov AT korobitsynbv zakonomernostidegradaciisvetoizlučaûŝihdiodov AT gorbachevve zakonomernostidegradaciisvetoizlučaûŝihdiodov |