Закономерности деградации светоизлучающих диодов
A method is proposed for testing gallium phosphide light-emitting diodes for service life, which significantly reduces the time required to reject unreliable diodes in production. The individual service life of each diode in a given batch is determined from two measured brightness values using a ref...
Saved in:
| Date: | 2004 |
|---|---|
| Main Authors: | , , , |
| Format: | Article |
| Language: | Ukrainian |
| Published: |
PE "Politekhperiodika", Book and Journal Publishers
2004
|
| Subjects: | |
| Online Access: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.2.55 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Technology and design in electronic equipment |