Закономерности деградации светоизлучающих диодов

• Date: 2004
• Main Authors: Vikulin, I. М., Irkha, V. I., Korobitsyn, B. V., Gorbachev, V. E.
• Format: Article
• Language: Ukrainian
• Published: PE "Politekhperiodika", Book and Journal Publishers 2004
• Subjects: светодиод; деградация; приработка; отбраковка
• Online Access: https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.2.55
• Journal Title: Technology and design in electronic equipment

A method is proposed for testing gallium phosphide light-emitting diodes for service life, which significantly reduces the time required to reject unreliable diodes in production. The individual service life of each diode in a given batch is determined from two measured brightness values using a ref...