Структуры на основе гетероперехода "кремний—арсенид галлия" для интегральных оптронов

A comparative analysis of the photoluminescence spectra of heteroepitaxial n‑GaAs layers and the spectral characteristics of p+‑Si—n‑Si—p‑Si—n+‑GaAs structures is presented. The GaAs layers were grown on Si substrates by liquid‑phase epitaxy from a solution‑melt. A complete coincidence of the maxima...

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Datum:2003
Hauptverfasser: Terletskaya, L. L., Kalinichenko, L. F., Golubtsov, V. V.
Format: Artikel
Sprache:Ukrainisch
Veröffentlicht: PE "Politekhperiodika", Book and Journal Publishers 2003
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Online Zugang:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2003.2.51
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Назва журналу:Technology and design in electronic equipment
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Technology and design in electronic equipment