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Математическое моделирование деградации керамических терморезисторов с отрицательным ТКС

The paper discusses the experimental results of low-temperature degradation of negative TCR thermistors based on transition metal manganites (Cu, Ni, Co, Mn)₃O₄. It is established for the first time that, regardless of the chemical composition and technological features of the preparation of the stu...

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Bibliographic Details
Published in:Технологія та конструювання в електронній апаратурі
Date:2002
Issue:6
Pages:10-13
ISSN:3083-6549
Author Affiliations:
  • V. A. Balitskaya — SPA «Karat», Lviv, Ukraine
  • N. M. Vakiv — SPA «Karat», Lviv, Ukraine
  • O. I. Shpotyuk — SPA «Karat», Lviv, Ukraine
Main Authors: Balitskaya, V. A., Vakiv, N. M., Shpotyuk, O. I.
Format: Article
Language:Vietnamese
Published: PE "Politekhperiodika", Book and Journal Publishers 2002
Subjects:
математическое моделирование
деградация
керамические терморезисторы
отрицательный ТКС
манганиты переходных металлов
термостарение
Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2002.6.10
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Journal Title:Technology and design in electronic equipment
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Technology and design in electronic equipment
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Summary:The paper discusses the experimental results of low-temperature degradation of negative TCR thermistors based on transition metal manganites (Cu, Ni, Co, Mn)₃O₄. It is established for the first time that, regardless of the chemical composition and technological features of the preparation of the studied ceramic samples, their thermal aging processes are described by the stretched exponential relaxation function of De Bast–Gillard or Williams–Watts.
ISSN:3083-6549

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