Контролепригодные двухканальные логические схемы цифровых компараторов

Testable dual-channel logic circuits of digital comparators intended for implementation in the form of printed circuit assemblies are considered. The testable logic circuits under consideration possess the property of self-checking with respect to single and unidirectional multiple stuck-at faults i...

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Bibliographic Details
Published in:Технологія та конструювання в електронній апаратурі
Date:2002
Issue:4–5
Pages:11-12
ISSN:3083-6549
Author Affiliations:
  • A. I. Timoshkin — Yuzhnoye Design Bureau, Dnepropetrovsk, Ukraine
Main Author: Timoshkin, A. I.
Format: Article
Language:yo
Published: PE "Politekhperiodika", Book and Journal Publishers 2002
Subjects:
Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2002.4-5.11
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Journal Title:Technology and design in electronic equipment
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Technology and design in electronic equipment

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