Здатнiсть псевдокiльцевих тестiв виявляти динамiчнi одиночнi несправностi у словоорiєнтованiй пам’ятi
This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution dete...
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| Date: | 2018 |
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| Main Authors: | , , |
| Format: | Article |
| Language: | English |
| Published: |
PE "Politekhperiodika", Book and Journal Publishers
2018
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| Subjects: | |
| Online Access: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2018.5-6.03 |
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| Journal Title: | Technology and design in electronic equipment |
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Technology and design in electronic equipment| Summary: | This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution determination results for pseudo-ring tests in relation to these faults in the word-oriented memory. Also, a comparative analysis of the pseudo-ring tests with known March tests is done. The results show that pseudo-ring tests with an algorithmic complexity of (30-60)N, where N is the number of all memory cells, can cover from 75 to 100% of all single dynamic faults. This advantage allows using pseudo-ring tests as an alternative to existing classical and March tests. |
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