Повышение радиационной устойчивости кремниевых монокристаллических эпитаксиальных слоев

The authors investigate the possibility of increasing the radiation resistance of silicon epitaxial layers by creating radiation defects sinks in the form of dislocation networks of the density of 109–1012 m–2. Such networks are created before the epitaxial layer is applied on the front sur...

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Datum:2014
Hauptverfasser: Kurmashev, Sh. D., Kulinich, O. A., Brusenskaya, G. I., Verem’eva, A. V.
Format: Artikel
Sprache:Ukrainian
Veröffentlicht: PE "Politekhperiodika", Book and Journal Publishers 2014
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Online Zugang:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2014.5-6.57
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Назва журналу:Technology and design in electronic equipment

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Technology and design in electronic equipment