Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов
It is shown that computer systems for measuring current-voltage characteristics are very important for semiconductor devices production. The main criteria of efficiency of such systems are defined. It is shown that efficiency of such systems significantly depends on the methods for measuring current...
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| Datum: | 2014 |
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| Format: | Artikel |
| Sprache: | Ukrainisch |
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PE "Politekhperiodika", Book and Journal Publishers
2014
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| Online Zugang: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2014.2-3.03 |
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| Назва журналу: | Technology and design in electronic equipment |
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Technology and design in electronic equipment| _version_ | 1856543818171547648 |
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| author | Iermolenko, Ia. O. |
| author_facet | Iermolenko, Ia. O. |
| author_sort | Iermolenko, Ia. O. |
| baseUrl_str | |
| collection | OJS |
| datestamp_date | 2025-05-30T19:34:08Z |
| description | It is shown that computer systems for measuring current-voltage characteristics are very important for semiconductor devices production. The main criteria of efficiency of such systems are defined. It is shown that efficiency of such systems significantly depends on the methods for measuring current-voltage characteristics of semiconductor devices. The aim of this work is to analyse existing methods for measuring current-voltage characteristics of semiconductor devices and to create the classification of these methods in order to specify the most effective solutions in terms of defined criteria.To achieve this aim, the most common classifications of methods for measuring current-voltage characteristics of semiconductor devices and their main disadvantages are considered. Automated and manual, continuous, pulse, mixed, isothermal and isodynamic methods for measuring current-voltage characteristics are analysed. As a result of the analysis and generalization of existing methods the next classification criteria are defined: the level of automation, the form of measurement signals, the condition of semiconductor device during the measurements, and the use of mathematical processing of the measurement results. With the use of these criteria, the classification scheme of methods for measuring current-voltage characteristics of semiconductor devices is composed and the most effective methods are specified. |
| first_indexed | 2025-09-24T17:30:44Z |
| format | Article |
| id | oai:tkea.com.ua:article-317 |
| institution | Technology and design in electronic equipment |
| language | Ukrainian |
| last_indexed | 2025-09-24T17:30:44Z |
| publishDate | 2014 |
| publisher | PE "Politekhperiodika", Book and Journal Publishers |
| record_format | ojs |
| spelling | oai:tkea.com.ua:article-3172025-05-30T19:34:08Z Classification of methods for measuring current-voltage characteristics of semiconductor devices Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов Iermolenko, Ia. O. current-voltage characteristic semiconductor device method of measurement classification вольт-амперная характеристика полупроводниковый прибор метод измерения классификация It is shown that computer systems for measuring current-voltage characteristics are very important for semiconductor devices production. The main criteria of efficiency of such systems are defined. It is shown that efficiency of such systems significantly depends on the methods for measuring current-voltage characteristics of semiconductor devices. The aim of this work is to analyse existing methods for measuring current-voltage characteristics of semiconductor devices and to create the classification of these methods in order to specify the most effective solutions in terms of defined criteria.To achieve this aim, the most common classifications of methods for measuring current-voltage characteristics of semiconductor devices and their main disadvantages are considered. Automated and manual, continuous, pulse, mixed, isothermal and isodynamic methods for measuring current-voltage characteristics are analysed. As a result of the analysis and generalization of existing methods the next classification criteria are defined: the level of automation, the form of measurement signals, the condition of semiconductor device during the measurements, and the use of mathematical processing of the measurement results. With the use of these criteria, the classification scheme of methods for measuring current-voltage characteristics of semiconductor devices is composed and the most effective methods are specified. Проведены анализ и обобщение методов измерения вольт-амперных характеристик (ВАХ) полупроводниковых приборов. Выделены их основные классификационные признаки и составлена классификация, с использованием которой определены наиболее эффективные методы измерения ВАХ с точки зрения сформулированных в работе критериев (длительность процесса измерения и степень его автоматизации, а также интенсивность саморазогрева полупроводниковых структур при измерениях). PE "Politekhperiodika", Book and Journal Publishers 2014-06-23 Article Article Peer-reviewed Article application/pdf https://www.tkea.com.ua/index.php/journal/article/view/TKEA2014.2-3.03 10.15222/TKEA2014.2-3.03 Technology and design in electronic equipment; No. 2–3 (2014): Tekhnologiya i konstruirovanie v elektronnoi apparature; 3-11 Технологія та конструювання в електронній апаратурі; № 2–3 (2014): Технология и конструирование в электронной аппаратуре; 3-11 3083-6549 3083-6530 uk https://www.tkea.com.ua/index.php/journal/article/view/TKEA2014.2-3.03/281 Copyright (c) 2014 Iermolenko Ia. O. http://creativecommons.org/licenses/by/4.0/ |
| spellingShingle | вольт-амперная характеристика полупроводниковый прибор метод измерения классификация Iermolenko, Ia. O. Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов |
| title | Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов |
| title_alt | Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_full | Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов |
| title_fullStr | Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов |
| title_full_unstemmed | Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов |
| title_short | Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов |
| title_sort | классификация методов измерения вольт-амперных характеристик полупроводниковых приборов |
| topic | вольт-амперная характеристика полупроводниковый прибор метод измерения классификация |
| topic_facet | current-voltage characteristic semiconductor device method of measurement classification вольт-амперная характеристика полупроводниковый прибор метод измерения классификация |
| url | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2014.2-3.03 |
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