Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов

Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов

It is shown that computer systems for measuring current-voltage characteristics are very important for semiconductor devices production. The main criteria of efficiency of such systems are defined. It is shown that efficiency of such systems significantly depends on the methods for measuring current...

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Datum:2014
1. Verfasser: Iermolenko, Ia. O.
Format: Artikel
Sprache:Ukrainian
Veröffentlicht: PE "Politekhperiodika", Book and Journal Publishers 2014
Schlagworte:
вольт-амперная характеристика
полупроводниковый прибор
метод измерения
классификация
Online Zugang:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2014.2-3.03
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Назва журналу:Technology and design in electronic equipment

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Technology and design in electronic equipment
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spelling oai:tkea.com.ua:article-3172025-05-30T19:34:08Z Classification of methods for measuring current-voltage characteristics of semiconductor devices Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов Iermolenko, Ia. O. current-voltage characteristic semiconductor device method of measurement classification вольт-амперная характеристика полупроводниковый прибор метод измерения классификация It is shown that computer systems for measuring current-voltage characteristics are very important for semiconductor devices production. The main criteria of efficiency of such systems are defined. It is shown that efficiency of such systems significantly depends on the methods for measuring current-voltage characteristics of semiconductor devices. The aim of this work is to analyse existing methods for measuring current-voltage characteristics of semiconductor devices and to create the classification of these methods in order to specify the most effective solutions in terms of defined criteria.To achieve this aim, the most common classifications of methods for measuring current-voltage characteristics of semiconductor devices and their main disadvantages are considered. Automated and manual, continuous, pulse, mixed, isothermal and isodynamic methods for measuring current-voltage characteristics are analysed. As a result of the analysis and generalization of existing methods the next classification criteria are defined: the level of automation, the form of measurement signals, the condition of semiconductor device during the measurements, and the use of mathematical processing of the measurement results. With the use of these criteria, the classification scheme of methods for measuring current-voltage characteristics of semiconductor devices is composed and the most effective methods are specified. Проведены анализ и обобщение методов измерения вольт-амперных характеристик (ВАХ) полупроводниковых приборов. Выделены их основные классификационные признаки и составлена классификация, с использованием которой определены наиболее эффективные методы измерения ВАХ с точки зрения сформулированных в работе критериев (длительность процесса измерения и степень его автоматизации, а также интенсивность саморазогрева по­лу­про­вод­ни­ко­вых структур при измерениях). PE "Politekhperiodika", Book and Journal Publishers 2014-06-23 Article Article Peer-reviewed Article application/pdf https://www.tkea.com.ua/index.php/journal/article/view/TKEA2014.2-3.03 10.15222/TKEA2014.2-3.03 Technology and design in electronic equipment; No. 2–3 (2014): Tekhnologiya i konstruirovanie v elektronnoi apparature; 3-11 Технологія та конструювання в електронній апаратурі; № 2–3 (2014): Технология и конструирование в электронной аппаратуре; 3-11 3083-6549 3083-6530 uk https://www.tkea.com.ua/index.php/journal/article/view/TKEA2014.2-3.03/281 Copyright (c) 2014 Iermolenko Ia. O. http://creativecommons.org/licenses/by/4.0/
institution Technology and design in electronic equipment
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datestamp_date 2025-05-30T19:34:08Z
collection OJS
language Ukrainian
topic вольт-амперная характеристика
полупроводниковый прибор
метод измерения
классификация
spellingShingle вольт-амперная характеристика
полупроводниковый прибор
метод измерения
классификация
Iermolenko, Ia. O.
Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов
topic_facet current-voltage characteristic
semiconductor device
method of measurement
classification
вольт-амперная характеристика
полупроводниковый прибор
метод измерения
классификация
format Article
author Iermolenko, Ia. O.
author_facet Iermolenko, Ia. O.
author_sort Iermolenko, Ia. O.
title Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов
title_short Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов
title_full Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов
title_fullStr Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов
title_full_unstemmed Классификация методов измерения вольт-амперных характеристик полупроводниковых приборов
title_sort классификация методов измерения вольт-амперных характеристик полупроводниковых приборов
title_alt Classification of methods for measuring current-voltage characteristics of semiconductor devices
description It is shown that computer systems for measuring current-voltage characteristics are very important for semiconductor devices production. The main criteria of efficiency of such systems are defined. It is shown that efficiency of such systems significantly depends on the methods for measuring current-voltage characteristics of semiconductor devices. The aim of this work is to analyse existing methods for measuring current-voltage characteristics of semiconductor devices and to create the classification of these methods in order to specify the most effective solutions in terms of defined criteria.To achieve this aim, the most common classifications of methods for measuring current-voltage characteristics of semiconductor devices and their main disadvantages are considered. Automated and manual, continuous, pulse, mixed, isothermal and isodynamic methods for measuring current-voltage characteristics are analysed. As a result of the analysis and generalization of existing methods the next classification criteria are defined: the level of automation, the form of measurement signals, the condition of semiconductor device during the measurements, and the use of mathematical processing of the measurement results. With the use of these criteria, the classification scheme of methods for measuring current-voltage characteristics of semiconductor devices is composed and the most effective methods are specified.
publisher PE "Politekhperiodika", Book and Journal Publishers
publishDate 2014
url https://www.tkea.com.ua/index.php/journal/article/view/TKEA2014.2-3.03
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first_indexed 2025-09-24T17:30:44Z
last_indexed 2025-09-24T17:30:44Z
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