Тепловая математическая модель полупроводниковых приборов при измерении ВАХ импульсным способом

The thermal mathematical model is used to estimate self-heating of semiconductor devices of various types during current-voltage characteristics measuring by the pulse method. The influence of self-heating on electrical parameters of semiconductor devices is analyzed. The recommendations for determi...

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Bibliographische Detailangaben
Datum:2012
Hauptverfasser: Yermolenko, Ye. O., Bondarenko, O. F., Baranov, O. M.
Format: Artikel
Sprache:Ukrainian
Veröffentlicht: PE "Politekhperiodika", Book and Journal Publishers 2012
Schlagworte:
Online Zugang:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.5.14
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Назва журналу:Technology and design in electronic equipment

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Technology and design in electronic equipment