Тепловая математическая модель полупроводниковых приборов при измерении ВАХ импульсным способом
The thermal mathematical model is used to estimate self-heating of semiconductor devices of various types during current-voltage characteristics measuring by the pulse method. The influence of self-heating on electrical parameters of semiconductor devices is analyzed. The recommendations for determi...
Saved in:
| Date: | 2012 |
|---|---|
| Main Authors: | , , |
| Format: | Article |
| Language: | Ukrainian |
| Published: |
PE "Politekhperiodika", Book and Journal Publishers
2012
|
| Subjects: | |
| Online Access: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.5.14 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Technology and design in electronic equipment |