Повышение надежности диодов Шоттки при воздействии разрядов cтатического элек­три­чес­тва

• Date: 2012
• Main Authors: Sоlоdukha, V. A., Turtsevich, A. S., Solov’yov, J. A., Rubtsevich, I. I., Kerentsev, A. F.
• Format: Article
• Language: Ukrainian
• Published: PE "Politekhperiodika", Book and Journal Publishers 2012
• Subjects: диод Шоттки; потенциальный барьер; разряд статического электричества
• Online Access: https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.5.22
• Journal Title: Technology and design in electronic equipment

Experimental studies of Schottky diodes with molybdenum barrier structure showed that resistance of the structures to electrostatic discharge depends on the design parameters, as well as on guard ring diffusion depth. It has been proven that to improve the reliability of Schottky diodes one should u...