Исследование качества пайки кристаллов мощных транзисторов релаксационным импеданс-спектрометром

• Date: 2012
• Main Authors: Turtsevich, A. S., Rubtsevich, I. I., Solov’yov, Ya. А., Vas’kov, O. S., Kononenko, V. K., Niss, V. S., Kerentsev, A. F.
• Format: Article
• Language: Ukrainian
• Published: PE "Politekhperiodika", Book and Journal Publishers 2012
• Subjects: транзистор; тепловое сопротивление; релаксационный импеданс-спектрометр; посадка кристалла
• Online Access: https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.5.44
• Journal Title: Technology and design in electronic equipment

Differential distribution profiles of the thermal «junction-to-case» resistance of KP723G transistors in accordance with the attachment of the crystals into the package have been investigated. Spectra of thermal resistances were calculated from the analysis of the temporal dependence of the dynamic...