Исследование температурной зависимости контактного сопротивления омических контактов к InP

It is experimentally confirmed that the temperature dependence of specific contact resistance of ohmic contacts Au–TiB2–Ge–Au–n–n+–n++-InP is described with the current transport model with a high density of dislocations in the contact region of the semiconductor. The samples used in the experiment...

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Bibliographic Details
Date:2012
Main Author: Novitskyi, S. V.
Format: Article
Language:Ukrainian
Published: PE "Politekhperiodika", Book and Journal Publishers 2012
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Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.4.32
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Journal Title:Technology and design in electronic equipment

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Technology and design in electronic equipment