Метод оценки качества тонкопленочной платы
A method for estimation of the quality of a thin-film board has been developed, based on the results of resistance measuring and instrumental errors calculation. Recommendations are given for the exclusion of gross errors in the application of the method. The practical estimation carried out shows t...
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| Date: | 2012 |
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| Main Author: | |
| Format: | Article |
| Language: | Ukrainian |
| Published: |
PE "Politekhperiodika", Book and Journal Publishers
2012
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| Subjects: | |
| Online Access: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.3.31 |
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| Journal Title: | Technology and design in electronic equipment |
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Technology and design in electronic equipment| Summary: | A method for estimation of the quality of a thin-film board has been developed, based on the results of resistance measuring and instrumental errors calculation. Recommendations are given for the exclusion of gross errors in the application of the method. The practical estimation carried out shows the high efficiency of the developed algorithms. This method allows increasing the boards yield by 1,5–2 times. |
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