Определение радиационной стойкости ИС с помощью низкоэнергетического излучения
A method is proposed for determination of radiation dose via the ionization current in the p–n-junction and of radiation resistance of MIS integrated circuits with the use of low-energy (10–40 keV) X-rays.
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| Date: | 2012 |
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| Main Author: | |
| Format: | Article |
| Language: | Ukrainian |
| Published: |
PE "Politekhperiodika", Book and Journal Publishers
2012
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| Subjects: | |
| Online Access: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.1.30 |
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| Journal Title: | Technology and design in electronic equipment |