Погрешности при измерении характеристик рентгеновских установок

Expressions for calculating the measurement errors of X-ray devices features are given as follows: mean photon energy, homogeneity coefficient, the first and the second half-value layer (1st HVL, 2nd HVL). Comparison of errors is organized at measurement and calculation of features of X-ray installa...

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Bibliographic Details
Date:2011
Main Authors: Dushkin, S. A., Ivanskiy, V. B., Kurov, A. M., Odinets, V. A., Orobinskiy, A. N.
Format: Article
Language:Ukrainian
Published: PE "Politekhperiodika", Book and Journal Publishers 2011
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Online Access:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2011.3.44
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Journal Title:Technology and design in electronic equipment

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Technology and design in electronic equipment