Исследование радиационной стойкости гибридных интегральных микросхем

The effect of fast electrons and neutrons has been studied on microsystems designed for measuring and stabilizing the temperature of primary converters of non-electrical quantities, whose transfer characteristics depend on temperature. A sufficiently high resistance of the main parameters of the mic...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Datum:2008
Hauptverfasser: Mokritskij, V. A., Banzak, O. V., Volosevich, V. P.
Format: Artikel
Sprache:Ukrainisch
Veröffentlicht: PE "Politekhperiodika", Book and Journal Publishers 2008
Schlagworte:
Online Zugang:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2008.4.14
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:Technology and design in electronic equipment

Institution

Technology and design in electronic equipment
Beschreibung
Zusammenfassung:The effect of fast electrons and neutrons has been studied on microsystems designed for measuring and stabilizing the temperature of primary converters of non-electrical quantities, whose transfer characteristics depend on temperature. A sufficiently high resistance of the main parameters of the microcircuits to such exposure has been revealed. The causes of changes in certain parameters under the influence of the mentioned radiation have been demonstrated.