Исследование радиационной стойкости гибридных интегральных микросхем

The effect of fast electrons and neutrons has been studied on microsystems designed for measuring and stabilizing the temperature of primary converters of non-electrical quantities, whose transfer characteristics depend on temperature. A sufficiently high resistance of the main parameters of the mic...

Повний опис

Збережено в:
Бібліографічні деталі
Дата:2008
Автори: Mokritskij, V. A., Banzak, O. V., Volosevich, V. P.
Формат: Стаття
Мова:Українська
Опубліковано: PE "Politekhperiodika", Book and Journal Publishers 2008
Теми:
Онлайн доступ:https://www.tkea.com.ua/index.php/journal/article/view/TKEA2008.4.14
Теги: Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
Назва журналу:Technology and design in electronic equipment

Репозитарії

Technology and design in electronic equipment
Опис
Резюме:The effect of fast electrons and neutrons has been studied on microsystems designed for measuring and stabilizing the temperature of primary converters of non-electrical quantities, whose transfer characteristics depend on temperature. A sufficiently high resistance of the main parameters of the microcircuits to such exposure has been revealed. The causes of changes in certain parameters under the influence of the mentioned radiation have been demonstrated.