Усовершенствованный метод выявления «горячих точек» в изделиях микроэлектроники
A new method of liquid‑crystal thermography for detecting “hot spots” in microelectronic device crystals has been developed. The method is based on the visual display of a “hot spot” by the local cholesteric phase within the transparent smectic phase of a cholesteric liquid crystal, against the clea...
Збережено в:
| Дата: | 2008 |
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| Автори: | , , |
| Формат: | Стаття |
| Мова: | Українська |
| Опубліковано: |
PE "Politekhperiodika", Book and Journal Publishers
2008
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| Теми: | |
| Онлайн доступ: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2008.3.55 |
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| Назва журналу: | Technology and design in electronic equipment |
Репозитарії
Technology and design in electronic equipment| Резюме: | A new method of liquid‑crystal thermography for detecting “hot spots” in microelectronic device crystals has been developed. The method is based on the visual display of a “hot spot” by the local cholesteric phase within the transparent smectic phase of a cholesteric liquid crystal, against the clear background of the topological elements of the device crystal surface. Examples of “hot spot” visualization on samples of crystals of various types of integrated circuits are presented. |
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