Усовершенствованный метод выявления «горячих точек» в изделиях микроэлектроники
A new method of liquid‑crystal thermography for detecting “hot spots” in microelectronic device crystals has been developed. The method is based on the visual display of a “hot spot” by the local cholesteric phase within the transparent smectic phase of a cholesteric liquid crystal, against the clea...
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| Datum: | 2008 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | Ukrainisch |
| Veröffentlicht: |
PE "Politekhperiodika", Book and Journal Publishers
2008
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| Schlagworte: | |
| Online Zugang: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2008.3.55 |
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| Назва журналу: | Technology and design in electronic equipment |