Оптимизация аппаратно-программного обеспечения для автоматизации спектрофотометра СФ-20
The hardware and software for automating measurements and processing spectral characteristics of semiconductor structures using the SF-20 spectrophotometer have been optimized. An electrical interface circuit has been proposed. At the software level, a method of double filtering of measured signals...
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| Datum: | 2006 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | Ukrainisch |
| Veröffentlicht: |
PE "Politekhperiodika", Book and Journal Publishers
2006
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| Schlagworte: | |
| Online Zugang: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2006.2.19 |
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| Назва журналу: | Technology and design in electronic equipment |