Molodkin, V. B., Olikhovskii, S. I., Kyslovskyy, Y. M., Len, E. G., Reshetnyk, O. V., Vladimirova, T. P., . . . Lizunova, S. V. (2010). Double- and triple-crystal X-ray diffractometry of microdefects in silicon.
Chicago-Zitierstil (17. Ausg.)Molodkin, V. B., S. I. Olikhovskii, Ye. M. Kyslovskyy, E. G. Len, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, und S. V. Lizunova. Double- and Triple-crystal X-ray Diffractometry of Microdefects in Silicon. 2010.
MLA-Zitierstil (8. Ausg.)Molodkin, V. B., et al. Double- and Triple-crystal X-ray Diffractometry of Microdefects in Silicon. 2010.
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