Molodkin, V. B., Olikhovskii, S. I., Kyslovskyy, Y. M., Len, E. G., Reshetnyk, O. V., Vladimirova, T. P., . . . Lizunova, S. V. (2010). Double- and triple-crystal X-ray diffractometry of microdefects in silicon.
Chicago Style (17th ed.) CitationMolodkin, V. B., S. I. Olikhovskii, Ye. M. Kyslovskyy, E. G. Len, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, and S. V. Lizunova. Double- and Triple-crystal X-ray Diffractometry of Microdefects in Silicon. 2010.
MLA (8th ed.) CitationMolodkin, V. B., et al. Double- and Triple-crystal X-ray Diffractometry of Microdefects in Silicon. 2010.
Warning: These citations may not always be 100% accurate.