Aliev, R., Mukhtarov, E., & Olimov, L. (2010). A non-destructive method for measuring the depth of occurrence of the p-n junction of semiconductor photoelectric structures.
Chicago-Zitierstil (17. Ausg.)Aliev, R., E. Mukhtarov, und L. Olimov. A Non-destructive Method for Measuring the Depth of Occurrence of the P-n Junction of Semiconductor Photoelectric Structures. 2010.
MLA-Zitierstil (8. Ausg.)Aliev, R., et al. A Non-destructive Method for Measuring the Depth of Occurrence of the P-n Junction of Semiconductor Photoelectric Structures. 2010.
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