Features of measurement and effective reducing of conductive noise caused by transistor converters

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Бібліографічні деталі
Дата:2020
Автори: V. K. Hurin, V. O. Pavlovskyi, O. M. Yurchenko
Формат: Стаття
Мова:Англійська
Опубліковано: 2020
Назва видання:Technical Electrodynamics
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0001180789
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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author V. K. Hurin
V. O. Pavlovskyi
O. M. Yurchenko
author_facet V. K. Hurin
V. O. Pavlovskyi
O. M. Yurchenko
author_sort V. K. Hurin
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institution Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-139162024-02-25T18:01:02Z Features of measurement and effective reducing of conductive noise caused by transistor converters V. K. Hurin V. O. Pavlovskyi O. M. Yurchenko 1607-7970 2020 en Technical Electrodynamics http://jnas.nbuv.gov.ua/article/UJRN-0001180789 Article
spellingShingle Technical Electrodynamics
V. K. Hurin
V. O. Pavlovskyi
O. M. Yurchenko
Features of measurement and effective reducing of conductive noise caused by transistor converters
title Features of measurement and effective reducing of conductive noise caused by transistor converters
title_full Features of measurement and effective reducing of conductive noise caused by transistor converters
title_fullStr Features of measurement and effective reducing of conductive noise caused by transistor converters
title_full_unstemmed Features of measurement and effective reducing of conductive noise caused by transistor converters
title_short Features of measurement and effective reducing of conductive noise caused by transistor converters
title_sort features of measurement and effective reducing of conductive noise caused by transistor converters
url http://jnas.nbuv.gov.ua/article/UJRN-0001180789
work_keys_str_mv AT vkhurin featuresofmeasurementandeffectivereducingofconductivenoisecausedbytransistorconverters
AT vopavlovskyi featuresofmeasurementandeffectivereducingofconductivenoisecausedbytransistorconverters
AT omyurchenko featuresofmeasurementandeffectivereducingofconductivenoisecausedbytransistorconverters