Features of measurement and effective reducing of conductive noise caused by transistor converters

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Bibliographic Details
Date:2020
Main Authors: V. K. Hurin, V. O. Pavlovskyi, O. M. Yurchenko
Format: Article
Language:English
Published: 2020
Series:Technical Electrodynamics
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0001180789
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Library portal of National Academy of Sciences of Ukraine | LibNAS
id open-sciencenbuvgovua-13916
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spelling open-sciencenbuvgovua-139162024-02-25T18:01:02Z Features of measurement and effective reducing of conductive noise caused by transistor converters V. K. Hurin V. O. Pavlovskyi O. M. Yurchenko 1607-7970 2020 en Technical Electrodynamics http://jnas.nbuv.gov.ua/article/UJRN-0001180789 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Technical Electrodynamics
spellingShingle Technical Electrodynamics
V. K. Hurin
V. O. Pavlovskyi
O. M. Yurchenko
Features of measurement and effective reducing of conductive noise caused by transistor converters
format Article
author V. K. Hurin
V. O. Pavlovskyi
O. M. Yurchenko
author_facet V. K. Hurin
V. O. Pavlovskyi
O. M. Yurchenko
author_sort V. K. Hurin
title Features of measurement and effective reducing of conductive noise caused by transistor converters
title_short Features of measurement and effective reducing of conductive noise caused by transistor converters
title_full Features of measurement and effective reducing of conductive noise caused by transistor converters
title_fullStr Features of measurement and effective reducing of conductive noise caused by transistor converters
title_full_unstemmed Features of measurement and effective reducing of conductive noise caused by transistor converters
title_sort features of measurement and effective reducing of conductive noise caused by transistor converters
publishDate 2020
url http://jnas.nbuv.gov.ua/article/UJRN-0001180789
work_keys_str_mv AT vkhurin featuresofmeasurementandeffectivereducingofconductivenoisecausedbytransistorconverters
AT vopavlovskyi featuresofmeasurementandeffectivereducingofconductivenoisecausedbytransistorconverters
AT omyurchenko featuresofmeasurementandeffectivereducingofconductivenoisecausedbytransistorconverters
first_indexed 2025-07-17T12:34:22Z
last_indexed 2025-07-17T12:34:22Z
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