Effect of pore depth on the effective minority carrier lifetime in macroporous silicon

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Date:2019
Main Authors: V. F. Onyshchenko, L. A. Karachevtseva
Format: Article
Language:English
Published: 2019
Series:Chemistry, physics and technology of surface
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0001032989
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Journal Title:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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author V. F. Onyshchenko
L. A. Karachevtseva
author_facet V. F. Onyshchenko
L. A. Karachevtseva
author_sort V. F. Onyshchenko
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first_indexed 2025-07-17T13:37:32Z
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institution Library portal of National Academy of Sciences of Ukraine | LibNAS
language English
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series Chemistry, physics and technology of surface
spelling open-sciencenbuvgovua-202112024-02-26T22:06:42Z Effect of pore depth on the effective minority carrier lifetime in macroporous silicon V. F. Onyshchenko L. A. Karachevtseva 2079-1704 2019 en Chemistry, physics and technology of surface http://jnas.nbuv.gov.ua/article/UJRN-0001032989 Article
spellingShingle Chemistry, physics and technology of surface
V. F. Onyshchenko
L. A. Karachevtseva
Effect of pore depth on the effective minority carrier lifetime in macroporous silicon
title Effect of pore depth on the effective minority carrier lifetime in macroporous silicon
title_full Effect of pore depth on the effective minority carrier lifetime in macroporous silicon
title_fullStr Effect of pore depth on the effective minority carrier lifetime in macroporous silicon
title_full_unstemmed Effect of pore depth on the effective minority carrier lifetime in macroporous silicon
title_short Effect of pore depth on the effective minority carrier lifetime in macroporous silicon
title_sort effect of pore depth on the effective minority carrier lifetime in macroporous silicon
url http://jnas.nbuv.gov.ua/article/UJRN-0001032989
work_keys_str_mv AT vfonyshchenko effectofporedepthontheeffectiveminoritycarrierlifetimeinmacroporoussilicon
AT lakarachevtseva effectofporedepthontheeffectiveminoritycarrierlifetimeinmacroporoussilicon