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Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data

Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data

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Bibliographic Details
Main Authors: M. D. Borcha, M. S. Solodkyi, S. V. Balovsyak, V. M. Tkach, I. I. Hutsuliak, A. R. Kuzmin, O. O. Tkach, V. P. Kladko, Yo. Gudymenko, O. I. Liubchenko
Format: Article
Language:English
Published: 2019
Series:Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0001073935
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http://jnas.nbuv.gov.ua/article/UJRN-0001073935

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