Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics
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| Datum: | 2019 |
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| Hauptverfasser: | , , , , , , , , , , , |
| Format: | Artikel |
| Sprache: | English |
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2019
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| Schriftenreihe: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Online Zugang: | http://jnas.nbuv.gov.ua/article/UJRN-0001073945 |
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open-sciencenbuvgovua-227772024-02-26T22:24:44Z Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics V. A. Vashchenko I. V. Yatsenko Yu. I. Kovalenko V. P. Kladko Yo. Gudymenko P. M. Lytvyn A. A. Korchovyi S. V. Mamykin O. S. Kondratenko V. P. Maslov H. V. Dorozinska G. V. Dorozinsky 1560-8034 2019 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0001073945 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Semiconductor Physics, Quantum Electronics and Optoelectronics |
| spellingShingle |
Semiconductor Physics, Quantum Electronics and Optoelectronics V. A. Vashchenko I. V. Yatsenko Yu. I. Kovalenko V. P. Kladko Yo. Gudymenko P. M. Lytvyn A. A. Korchovyi S. V. Mamykin O. S. Kondratenko V. P. Maslov H. V. Dorozinska G. V. Dorozinsky Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics |
| format |
Article |
| author |
V. A. Vashchenko I. V. Yatsenko Yu. I. Kovalenko V. P. Kladko Yo. Gudymenko P. M. Lytvyn A. A. Korchovyi S. V. Mamykin O. S. Kondratenko V. P. Maslov H. V. Dorozinska G. V. Dorozinsky |
| author_facet |
V. A. Vashchenko I. V. Yatsenko Yu. I. Kovalenko V. P. Kladko Yo. Gudymenko P. M. Lytvyn A. A. Korchovyi S. V. Mamykin O. S. Kondratenko V. P. Maslov H. V. Dorozinska G. V. Dorozinsky |
| author_sort |
V. A. Vashchenko |
| title |
Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics |
| title_short |
Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics |
| title_full |
Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics |
| title_fullStr |
Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics |
| title_full_unstemmed |
Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics |
| title_sort |
effect of electron-beam treatment of sensor glass substrates for spr devices on their metrological characteristics |
| publishDate |
2019 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0001073945 |
| work_keys_str_mv |
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| first_indexed |
2025-07-17T14:00:03Z |
| last_indexed |
2025-07-17T14:00:03Z |
| _version_ |
1850413452899647488 |