Modeling the transient processes in measurement channel of eddy-current flaw detector

Modeling the transient processes in measurement channel of eddy-current flaw detector

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Bibliographische Detailangaben
Datum:	2018
Hauptverfasser:	V. V. Dolynenko, Ye. V. Shapovalov, Yu. V. Kuts, M. O. Redka, V. M. Uchanin
Format:	Artikel
Sprache:	English
Veröffentlicht:	2018
Schriftenreihe:	Technical diagnostics and non-destructive testing
Online Zugang:	http://jnas.nbuv.gov.ua/article/UJRN-0000949009
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Назва журналу:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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