Modeling the transient processes in measurement channel of eddy-current flaw detector
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| Date: | 2018 |
|---|---|
| Main Authors: | V. V. Dolynenko, Ye. V. Shapovalov, Yu. V. Kuts, M. O. Redka, V. M. Uchanin |
| Format: | Article |
| Language: | English |
| Published: |
2018
|
| Series: | Technical diagnostics and non-destructive testing |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000949009 |
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| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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