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Imation of the electrical and thermal contact rsistances and thermoemf of &quot;thermoelectric material-metal&quot; transient contact layer due to semiconductor surface roughness

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Datum:	2018
1. Verfasser:	P. V. Gorskij
Format:	Artikel
Sprache:	Englisch
Veröffentlicht:	2018
Schriftenreihe:	Journal of Thermoelectricity
Online Zugang:	http://jnas.nbuv.gov.ua/article/UJRN-0001094146
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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