Automated hardware-softw are system for measurement of thermoelectric parameters of semiconductor materials

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Bibliographic Details
Date:2018
Main Author: B. S. Dzundza
Format: Article
Language:English
Published: 2018
Series:Journal of Thermoelectricity
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0001094194
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Journal Title:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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author B. S. Dzundza
author_facet B. S. Dzundza
author_sort B. S. Dzundza
collection Open-Science
first_indexed 2025-07-17T17:31:39Z
format Article
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institution Library portal of National Academy of Sciences of Ukraine | LibNAS
language English
last_indexed 2025-07-17T17:31:39Z
publishDate 2018
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series Journal of Thermoelectricity
spelling open-sciencenbuvgovua-344582024-02-27T22:16:39Z Automated hardware-softw are system for measurement of thermoelectric parameters of semiconductor materials B. S. Dzundza 1726-7692 2018 en Journal of Thermoelectricity http://jnas.nbuv.gov.ua/article/UJRN-0001094194 Article
spellingShingle Journal of Thermoelectricity
B. S. Dzundza
Automated hardware-softw are system for measurement of thermoelectric parameters of semiconductor materials
title Automated hardware-softw are system for measurement of thermoelectric parameters of semiconductor materials
title_full Automated hardware-softw are system for measurement of thermoelectric parameters of semiconductor materials
title_fullStr Automated hardware-softw are system for measurement of thermoelectric parameters of semiconductor materials
title_full_unstemmed Automated hardware-softw are system for measurement of thermoelectric parameters of semiconductor materials
title_short Automated hardware-softw are system for measurement of thermoelectric parameters of semiconductor materials
title_sort automated hardware-softw are system for measurement of thermoelectric parameters of semiconductor materials
url http://jnas.nbuv.gov.ua/article/UJRN-0001094194
work_keys_str_mv AT bsdzundza automatedhardwaresoftwaresystemformeasurementofthermoelectricparametersofsemiconductormaterials