Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness
Збережено в:
Дата: | 2018 |
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Автор: | |
Формат: | Стаття |
Мова: | English |
Опубліковано: |
2018
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Назва видання: | Journal of Thermoelectricity |
Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0001095449 |
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open-sciencenbuvgovua-345702024-02-27T22:17:02Z Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness P. V. Horskyi 1726-7714 2018 en Journal of Thermoelectricity http://jnas.nbuv.gov.ua/article/UJRN-0001095449 Article |
institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
collection |
Open-Science |
language |
English |
series |
Journal of Thermoelectricity |
spellingShingle |
Journal of Thermoelectricity P. V. Horskyi Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
format |
Article |
author |
P. V. Horskyi |
author_facet |
P. V. Horskyi |
author_sort |
P. V. Horskyi |
title |
Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
title_short |
Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
title_full |
Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
title_fullStr |
Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
title_full_unstemmed |
Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
title_sort |
imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
publishDate |
2018 |
url |
http://jnas.nbuv.gov.ua/article/UJRN-0001095449 |
work_keys_str_mv |
AT pvhorskyi imationoftheelectricalandthermalcontactrsistancesandthermoemfofquotthermoelectricmaterialmetalquottransientcontactlayerduetosemiconductorsurfaceroughness |
first_indexed |
2024-03-30T08:51:18Z |
last_indexed |
2024-03-30T08:51:18Z |
_version_ |
1796880878543044608 |