Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness
Збережено в:
| Дата: | 2018 |
|---|---|
| Автор: | |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
2018
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| Назва видання: | Journal of Thermoelectricity |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0001095449 |
| Теги: |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859508736326893568 |
|---|---|
| author | P. V. Horskyi |
| author_facet | P. V. Horskyi |
| author_sort | P. V. Horskyi |
| collection | Open-Science |
| first_indexed | 2025-07-17T17:33:49Z |
| format | Article |
| id | open-sciencenbuvgovua-34570 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-17T17:33:49Z |
| publishDate | 2018 |
| record_format | dspace |
| series | Journal of Thermoelectricity |
| spelling | open-sciencenbuvgovua-345702024-02-27T22:17:02Z Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness P. V. Horskyi 1726-7714 2018 en Journal of Thermoelectricity http://jnas.nbuv.gov.ua/article/UJRN-0001095449 Article |
| spellingShingle | Journal of Thermoelectricity P. V. Horskyi Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
| title | Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
| title_full | Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
| title_fullStr | Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
| title_full_unstemmed | Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
| title_short | Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
| title_sort | imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0001095449 |
| work_keys_str_mv | AT pvhorskyi imationoftheelectricalandthermalcontactrsistancesandthermoemfofampquotthermoelectricmaterialmetalampquottransientcontactlayerduetosemiconductorsurfaceroughness |