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Imation of the electrical and thermal contact rsistances and thermoemf of &quot;thermoelectric material-metal&quot; transient contact layer due to semiconductor surface roughness

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Bibliographic Details
Date:	2018
Main Author:	P. V. Horskyi
Format:	Article
Language:	English
Published:	2018
Series:	Journal of Thermoelectricity
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0001095449
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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