APA (7th ed.) Citation

Lukin, K. A., Tatjanko, D. N., Pikh, A. B., & Zemljanyj, O. V. (2017). Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method.

Chicago Style (17th ed.) Citation

Lukin, K. A., D. N. Tatjanko, A. B. Pikh, and O. V. Zemljanyj. Measurement of Thicknesses of Optically Transparent Layered Structures by the Spectral Interferometry Method. 2017.

MLA (8th ed.) Citation

Lukin, K. A., et al. Measurement of Thicknesses of Optically Transparent Layered Structures by the Spectral Interferometry Method. 2017.

Warning: These citations may not always be 100% accurate.