Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method
Збережено в:
| Дата: | 2017 |
|---|---|
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
2017
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| Назва видання: | Radiophysics and Electronics |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000685034 |
| Теги: |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859508911402385408 |
|---|---|
| author | K. A. Lukin D. N. Tatjanko A. B. Pikh O. V. Zemljanyj |
| author_facet | K. A. Lukin D. N. Tatjanko A. B. Pikh O. V. Zemljanyj |
| author_sort | K. A. Lukin |
| collection | Open-Science |
| first_indexed | 2025-07-17T17:58:12Z |
| format | Article |
| id | open-sciencenbuvgovua-35574 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-17T17:58:12Z |
| publishDate | 2017 |
| record_format | dspace |
| series | Radiophysics and Electronics |
| spelling | open-sciencenbuvgovua-355742024-02-29T11:28:00Z Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method K. A. Lukin D. N. Tatjanko A. B. Pikh O. V. Zemljanyj 1028-821X 2017 en Radiophysics and Electronics http://jnas.nbuv.gov.ua/article/UJRN-0000685034 Article |
| spellingShingle | Radiophysics and Electronics K. A. Lukin D. N. Tatjanko A. B. Pikh O. V. Zemljanyj Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
| title | Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
| title_full | Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
| title_fullStr | Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
| title_full_unstemmed | Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
| title_short | Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
| title_sort | measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0000685034 |
| work_keys_str_mv | AT kalukin measurementofthicknessesofopticallytransparentlayeredstructuresbythespectralinterferometrymethod AT dntatjanko measurementofthicknessesofopticallytransparentlayeredstructuresbythespectralinterferometrymethod AT abpikh measurementofthicknessesofopticallytransparentlayeredstructuresbythespectralinterferometrymethod AT ovzemljanyj measurementofthicknessesofopticallytransparentlayeredstructuresbythespectralinterferometrymethod |