2025-02-22T23:36:43-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-35574%22&qt=morelikethis&rows=5
2025-02-22T23:36:43-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-35574%22&qt=morelikethis&rows=5
2025-02-22T23:36:43-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-22T23:36:43-05:00 DEBUG: Deserialized SOLR response
Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method
Saved in:
Main Authors: | , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
2017
|
Series: | Radiophysics and Electronics |
Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000685034 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
id |
open-sciencenbuvgovua-35574 |
---|---|
record_format |
dspace |
spelling |
open-sciencenbuvgovua-355742024-02-29T11:28:00Z Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method K. A. Lukin D. N. Tatjanko A. B. Pikh O. V. Zemljanyj 1028-821X 2017 en Radiophysics and Electronics http://jnas.nbuv.gov.ua/article/UJRN-0000685034 Article |
institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
collection |
Open-Science |
language |
English |
series |
Radiophysics and Electronics |
spellingShingle |
Radiophysics and Electronics K. A. Lukin D. N. Tatjanko A. B. Pikh O. V. Zemljanyj Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
format |
Article |
author |
K. A. Lukin D. N. Tatjanko A. B. Pikh O. V. Zemljanyj |
author_facet |
K. A. Lukin D. N. Tatjanko A. B. Pikh O. V. Zemljanyj |
author_sort |
K. A. Lukin |
title |
Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
title_short |
Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
title_full |
Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
title_fullStr |
Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
title_full_unstemmed |
Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
title_sort |
measurement of thicknesses of optically transparent layered structures by the spectral interferometry method |
publishDate |
2017 |
url |
http://jnas.nbuv.gov.ua/article/UJRN-0000685034 |
work_keys_str_mv |
AT kalukin measurementofthicknessesofopticallytransparentlayeredstructuresbythespectralinterferometrymethod AT dntatjanko measurementofthicknessesofopticallytransparentlayeredstructuresbythespectralinterferometrymethod AT abpikh measurementofthicknessesofopticallytransparentlayeredstructuresbythespectralinterferometrymethod AT ovzemljanyj measurementofthicknessesofopticallytransparentlayeredstructuresbythespectralinterferometrymethod |
first_indexed |
2024-03-30T08:56:36Z |
last_indexed |
2024-03-30T08:56:36Z |
_version_ |
1796880983423713280 |