2025-02-22T23:47:16-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-35574%22&qt=morelikethis&rows=5
2025-02-22T23:47:16-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-35574%22&qt=morelikethis&rows=5
2025-02-22T23:47:16-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-22T23:47:16-05:00 DEBUG: Deserialized SOLR response
Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method

Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method

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Bibliographic Details
Main Authors: K. A. Lukin, D. N. Tatjanko, A. B. Pikh, O. V. Zemljanyj
Format: Article
Language:English
Published: 2017
Series:Radiophysics and Electronics
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000685034
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2025-02-22T23:47:16-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&rows=40&rows=5&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-35574%22&qt=morelikethis
2025-02-22T23:47:16-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&rows=40&rows=5&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-35574%22&qt=morelikethis
2025-02-22T23:47:16-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-22T23:47:16-05:00 DEBUG: Deserialized SOLR response

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