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Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method

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Bibliographic Details
Date:	2017
Main Authors:	K. A. Lukin, D. N. Tatjanko, A. B. Pikh, O. V. Zemljanyj
Format:	Article
Language:	English
Published:	2017
Series:	Radiophysics and Electronics
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000685034
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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