Troitskij, V. A., Mikhajlov, S. R., & Pastovenskij, R. O. (2017). X-ray mini testing technology based on solid plane-parallel detectors.
Chicago Style (17th ed.) CitationTroitskij, V. A., S. R. Mikhajlov, and R. O. Pastovenskij. X-ray Mini Testing Technology Based on Solid Plane-parallel Detectors. 2017.
MLA (8th ed.) CitationTroitskij, V. A., et al. X-ray Mini Testing Technology Based on Solid Plane-parallel Detectors. 2017.
Warning: These citations may not always be 100% accurate.