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X-ray mini testing technology based on solid plane-parallel detectors

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Bibliographic Details
Date:	2017
Main Authors:	V. A. Troitskij, S. R. Mikhajlov, R. O. Pastovenskij
Format:	Article
Language:	English
Published:	2017
Series:	Technical diagnostics and non-destructive testing
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000741507
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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