APA (7th ed.) Citation

Gavrysh, V. I., Tushnitskij, R. B., Krajovskij, J., & Levus, E. V. (2017). Investigation of temperature fields in microelectronic devices of layered structure with through inclusions.

Chicago Style (17th ed.) Citation

Gavrysh, V. I., R. B. Tushnitskij, Ja Krajovskij, and E. V. Levus. Investigation of Temperature Fields in Microelectronic Devices of Layered Structure with Through Inclusions. 2017.

MLA (8th ed.) Citation

Gavrysh, V. I., et al. Investigation of Temperature Fields in Microelectronic Devices of Layered Structure with Through Inclusions. 2017.

Warning: These citations may not always be 100% accurate.